Your browser doesn't support javascript.
loading
Towards 3D determination of the surface roughness of core-shell microparticles as a routine quality control procedure by scanning electron microscopy.
Hülagü, Deniz; Tobias, Charlie; Dao, Radek; Komarov, Pavel; Rurack, Knut; Hodoroaba, Vasile-Dan.
Afiliação
  • Hülagü D; Division 6.1 Surface and Thin Film Analysis, Federal Institute for Materials Research and Testing (BAM), Unter den Eichen 44-46, 12203, Berlin, Germany. deniz.huelague@bam.de.
  • Tobias C; Division 1.9 Chemical and Optical Sensing, Federal Institute for Materials Research and Testing (BAM), Richard-Willstätter-Straße 11, 12489, Berlin, Germany.
  • Dao R; NenoVision S.R.O., Purkynova 649/127, 612 00, Brno, Czech Republic.
  • Komarov P; NenoVision S.R.O., Purkynova 649/127, 612 00, Brno, Czech Republic.
  • Rurack K; Division 1.9 Chemical and Optical Sensing, Federal Institute for Materials Research and Testing (BAM), Richard-Willstätter-Straße 11, 12489, Berlin, Germany.
  • Hodoroaba VD; Division 6.1 Surface and Thin Film Analysis, Federal Institute for Materials Research and Testing (BAM), Unter den Eichen 44-46, 12203, Berlin, Germany. dan.hodoroaba@bam.de.
Sci Rep ; 14(1): 17936, 2024 Aug 02.
Article em En | MEDLINE | ID: mdl-39095507
ABSTRACT
Recently, we have developed an algorithm to quantitatively evaluate the roughness of spherical microparticles using scanning electron microscopy (SEM) images. The algorithm calculates the root-mean-squared profile roughness (RMS-RQ) of a single particle by analyzing the particle's boundary. The information extracted from a single SEM image yields however only two-dimensional (2D) profile roughness data from the horizontal plane of a particle. The present study offers a practical procedure and the necessary software tools to gain quasi three-dimensional (3D) information from 2D particle contours recorded at different particle inclinations by tilting the sample (stage). This new approach was tested on a set of polystyrene core-iron oxide shell-silica shell particles as few micrometer-sized beads with different (tailored) surface roughness, providing the proof of principle that validates the applicability of the proposed method. SEM images of these particles were analyzed by the latest version of the developed algorithm, which allows to determine the analysis of particles in terms of roughness both within a batch and across the batches as a routine quality control procedure. A separate set of particles has been analyzed by atomic force microscopy (AFM) as a powerful complementary surface analysis technique integrated into SEM, and the roughness results have been compared.
Palavras-chave

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2024 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2024 Tipo de documento: Article