Modelling two-laser asynchronous optical sampling using a single 2-section semiconductor mode-locked laser diode.

We present a theoretical overview and a proposed methodology which demonstrates SLASOPS (single laser asynchronous optical sampling) as a single-laser alternative to the conventional two-laser ASOPS technique. We propose the optical and electronic setup in which SLASOPS may be achieved experimentally with a single 2-section mode-locked laser diode as the pulsed-laser source and simulate how asynchronous optical sampling is generated and detected theoretically. We highlight the technique's ability to provide customizable scan ranges, scan rates and scan resolutions through variation of the imbalance in the interferometer arms and by tuning the repetition rate of the pulsed-laser source, which we present as optical cross-correlations between pulse pairs. We incorporate jitter into the system mathematically to assess the limitations on resolving both intensity and interferometric cross-correlation traces and to investigate the effects of averaging such traces in real-time. Analysis is then carried out on cross-correlation trace amplitude, width, and temporal positioning in order to discuss the technique's ability for deployment in typical optical sampling applications. In particular we note SLASOPS' ability to conduct asynchronous optical sampling using only a single laser, halving both the expense and technical requirements, doing so at megahertz scan rates, and within a spatial precision of just a few microns.

Fast optical sampling by electronic repetition-rate tuning using a single mode-locked laser diode.

This paper demonstrates optical sampling by electronic repetition-rate tuning (OSBERT): a single-laser optical sampling technique capable of fast scan rates and customisable scan ranges. The method has no moving parts and is based on the electronic modulation of the repetition rate of a passively mode-locked laser diode, simply by varying the reverse bias applied directly to the saturable absorber section of the laser. Varying the repetition rate in a system built as a highly imbalanced interferometer results in pairs of (pump, probe) pulses with successive increasing delay. The resulting scan range is proportional to the magnitude of the repetition rate modulation and is scaled by the chosen length of the imbalance. As a first proof of concept, we apply the method to distance measurement, where the displacement of a target across 13.0 mm was detected with ∼0.1 mm standard deviation from an equivalent free-space distance of 36 m and at a real-time scan rate of 1 kHz. The customizable scan range and competitive scan rate of the method paves the way for single ultrafast semiconductor laser diodes to be deployed as fast, low-cost, and compact optical sampling systems in metrology, biomedical microscopy, and sensing applications.

Megahertz scan rates enabled by optical sampling by repetition-rate tuning.

We demonstrate, for the first time, optical sampling by repetition-rate tuning (OSBERT) at record megahertz scan rates. A low-cost, tunable and extremely compact 2-section passively mode-locked laser diode (MLLD) is used as the pulsed laser source, whose repetition rate can be modulated electronically through biasing of the saturable absorber section. The pulsed output is split into two arms comparable to an imbalanced Michelson interferometer, where one arm is significantly longer than the other (a passive delay line, or PDL). The resulting electronic detuning of the repetition rate gives rise to a temporal delay between pulse pairs at a detector; the basis for time-resolved spectroscopy. Through impedance-matching, we developed a new system whereby a sinusoidal electrical bias could be applied to the absorber section of the MLLD via a signal generator, whose frequency could be instantly increased from sub-hertz through to megahertz modulation frequencies, corresponding to a ground-breaking megahertz optical sampling scan rate, which was experimentally demonstrated by the real-time acquisition of a cross-correlation trace of two ultrashort optical pulses within just 1 microsecond of real time. This represents scan rates which are three orders of magnitude greater than the recorded demonstrations of OSBERT to date, and paves the way for highly competitive scan rates across the field of time-resolved spectroscopy and applications therein which range from pump probe spectroscopy to metrology.

Role of surface microgeometries on electron escape probability and secondary electron yield of metal surfaces.

The influence of microgeometries on the Secondary Electron Yield (SEY) of surfaces is investigated. Laser written structures of different aspect ratio (height to width) on a copper surface tuned the SEY of the surface and reduced its value to less than unity. The aspect ratio of microstructures was methodically controlled by varying the laser parameters. The results obtained corroborate a recent theoretical model of SEY reduction as a function of the aspect ratio of microstructures. Nanostructures - which are formed inside the microstructures during the interaction with the laser beam - provided further reduction in SEY comparable to that obtained in the simulation of structures which were coated with an absorptive layer suppressing secondary electron emission.