Photo-induced thermal radiation of optical interference coatings submitted to a spatio-temporal illumination.

We present an electromagnetic model for photo-induced thermal radiation in multi-layer interference filters subjected to arbitrary pulsed illumination with limited beam size. Numerical calculation is used to analyze various structures affecting thermal radiation, such as multi-dielectric mirrors in the mid-infrared range. Other zero-admittance structures are shown to strongly confine and enhance the thermal radiation with an emissivity close to unity at pre-defined frequencies (wavelength and angles). Calculation tools are chosen that encourage the use of techniques for synthesizing thin-film multilayers able to control thermal radiation.

Photo-induced temperature in optical interference coatings.

The photo-induced temperature in multilayer systems is calculated using an original analytical model based on optical/thermal analogies. Various illumination regimes are considered, ranging from ps pulses to a continuous regime, while taking into account a variable repetition rate. The temporal and spatial (3D) resolutions are quantified, and the distributions of temperature and stationary optical field are compared. The temperature spectra are given as a function of the illumination wavelength. Thermal and electromagnetic damage thresholds are compared. Lastly, the thermal fringes resulting from structured optical illumination are studied.

Semi-automated method for the determination of the all-optical monitoring strategy of complex thin-film filters.

One of the critical steps in the fabrication of complex optical interference filters is the precise control of the thickness of the layers during the fabrication process. However, the definition of the optimal optical monitoring strategy remains a challenge as it relies on user experience and there is no reliable automatic determination of this strategy. Here, we propose a semi-automated method that allows the determination of the optimal strategy. It is based on the combination of trinary mappings to select spectral regions that are compatible with optical monitoring and the use of the reflected phase error at a single wavelength versus optical monitoring wavelength. We show how this procedure can be used for the determination of either a single optical monitoring wavelength or a multi-wavelength procedure of a complex filter and confirm these theoretical results with an experimental demonstration.

In situ optical monitoring of Fabry-Perot multilayer structures: analysis of current techniques and optimized procedures.

Single cavity Fabry-Perot filters are one of the most popular designs for the production of narrow bandpass filters. The usual deposition strategy to create such filters based on optical monitoring at the filter central wavelength is well-known and has proven its strength over decades. We review in this paper the possible optical methods to monitor such a filter during production and analyze their strengths and weaknesses. Then, we discuss a new monitoring procedure, mixing different methods, to minimize the production errors of this filter while maintaining a precise filter centering. This strategy is applied on different bandpass filter designs.

Comparison of surface and bulk scattering in optical multilayers.

Electromagnetic theories provide a tool to detect the origin of scattering in optical multilayers. Illumination and observation conditions that cause surface and bulk scatterings to have different behaviors are pointed out. Angular, wavelength, and polarization dependences are investigated for the location of structural irregularities at interfaces or in the bulk of a multilayer. Specific experiments can be designed.

Description of a scattering apparatus: application to the problems of characterization of opaque surfaces.

We show how the complexity of a micropolished optical surface can be investigated in detail by measurement of the distribution of scattered light. We deal with problems of roughness anisotropy and uniformity together with cleaning problems. Experimental results concern numerous black glasses from different polishing shops and allow a determination of the polish inhomogeneity in a same glass set. After that, we present a detailed study of the apparatus function of the scatterometer, and we determine the limits of validity of our optical characterization method.

Layer uniformity obtained by vacuum evaporation: application to Fabry-Perot filters.

We show how we can measure with accuracy the distribution law of thicknesses deposited inside a vacuum chamber. These measurement techniques are applied to the simultaneous production of high rejection narrowband multiple halfwave Fabry-Perot filters. To prevent any alteration of the filters' optical properties, we must control the variations vs time of the evaporant distribution.

Nd:MgO:LiNbO(3) waveguide laser and amplifier.

We report efficient operation of a channel waveguide laser and a channel waveguide amplifier in Nd:MgO:LiNbO(3). For the laser a cw output power of 2.9 mW was obtained for 23.6 mW of absorbed pump power. The absorbed pump power at threshold was 1.5 mW, and a slope efficiency of 13% was achieved. For the amplifier a small-signal gain of 7.5 dB was achieved for 22 mW of coupled pump power.