RESUMO
The remanent magnetization of a hard ferromagnetic CoPtCr layer is progressively decreased by repeated switching of a neighboring soft magnetic layer. We show that this effect depends strongly on the thickness of the CoPtCr layer and the spacing between the hard and soft layers. We propose a model that accounts for these results: An interlayer magnetostatic coupling is induced by large stray fields from domain walls that form within the soft layer during its magnetization reversal.
RESUMO
The demagnetization of a hard ferromagnetic layer via the fringing fields of domain walls created by reversing the moment of a neighboring soft ferromagnetic layer is explored experimentally. An unusual oscillatory decay of the magnetic moment of the hard layer is observed using structures in which the demagnetization occurs after a few hundred cycles. This surprising observation is confirmed on a microscopic scale by detailed imaging of the magnetization of the hard layer using high resolution photoemission electron microscopy and by micromagnetic simulations.
RESUMO
We have measured the rate of thermally assisted magnetization reversal of submicron-sized magnetic thin films. For fields H just less than the zero-temperature switching field H(C), the probability of reversal, P(exp)(s)(t), increases for short times t, achieves a maximum value, and then decreases exponentially. Micromagnetic simulations exhibit the same behavior and show that the reversal proceeds through the annihilation of two domain walls that move from opposite sides of the sample. The behavior of P(exp)(s)(t) can be understood through a simple "energy-ladder" model of thermal activation.