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1.
J Synchrotron Radiat ; 30(Pt 1): 242-250, 2023 Jan 01.
Artigo em Inglês | MEDLINE | ID: mdl-36601943

RESUMO

The PERCIVAL detector is a CMOS imager designed for the soft X-ray regime at photon sources. Although still in its final development phase, it has recently seen its first user experiments: ptychography at a free-electron laser, holographic imaging at a storage ring and preliminary tests on X-ray photon correlation spectroscopy. The detector performed remarkably well in terms of spatial resolution achievable in the sample plane, owing to its small pixel size, large active area and very large dynamic range; but also in terms of its frame rate, which is significantly faster than traditional CCDs. In particular, it is the combination of these features which makes PERCIVAL an attractive option for soft X-ray science.


Assuntos
Fótons , Radiografia , Raios X
2.
Opt Express ; 20(12): 13501-12, 2012 Jun 04.
Artigo em Inglês | MEDLINE | ID: mdl-22714377

RESUMO

The emergence of femtosecond diffractive imaging with X-ray lasers has enabled pioneering structural studies of isolated particles, such as viruses, at nanometer length scales. However, the issue of missing low frequency data significantly limits the potential of X-ray lasers to reveal sub-nanometer details of micrometer-sized samples. We have developed a new technique of dark-field coherent diffractive imaging to simultaneously overcome the missing data issue and enable us to harness the unique contrast mechanisms available in dark-field microscopy. Images of airborne particulate matter (soot) up to two microns in length were obtained using single-shot diffraction patterns obtained at the Linac Coherent Light Source, four times the size of objects previously imaged in similar experiments. This technique opens the door to femtosecond diffractive imaging of a wide range of micrometer-sized materials that exhibit irreproducible complexity down to the nanoscale, including airborne particulate matter, small cells, bacteria and gold-labeled biological samples.


Assuntos
Elétrons , Imageamento Tridimensional/métodos , Lasers , Simulação por Computador , Microscopia Eletrônica de Transmissão , Fuligem/análise , Fatores de Tempo , Raios X
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