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1.
Environ Monit Assess ; 188(10): 558, 2015 Oct.
Artigo em Inglês | MEDLINE | ID: mdl-27614958

RESUMO

Visible and near infrared reflectance (VNIR; 350-2500 nm) spectroscopy has greatly been used in soils, especially for studying variability in spectrally active soil components (e.g., organic carbon, clays, and Fe/Al oxides) based on their diagnostic spectral features. In recent years, this technique has also been applied to assess soil metallic ions. In this research, the feasibility of VNIR spectroscopy for determination of soil metals was investigated with two soil data sets: (i) artificially metal-spiked and (ii) in situ metal-contaminated soils. Results showed that reflectance spectra of neither metal-spiked soils with Cd, As, and Pb even at their higher concentrations of 20, 900, and 1200 mg kg(-1), respectively, nor in situ metal-contaminated soils (with concentrations of 30 mg Cd, 3019 mg As, and 5725 mg Pb kg(-1) soil) showed any recognized absorption peaks that correspond to soil metal concentrations. We observed variations in reflectance intensity for in situ metal-contaminated soils only, showing higher reflectance across the entire spectrum for strongly and lower for less metal-contaminated soils. A significant correlation was found between surface soil metals' concentrations and continuum removed spectra, while soil metals were also found significantly associated with soil organic matter and total Fe. A partial least square regression with cross-validation approach produced an acceptable prediction of metals (R (2) = 0.58-0.94) for both soil data sets, metal-spiked and in situ metal-contaminated soils. However, high values of root mean square error ruled out practical application of the achieved prediction models.


Assuntos
Monitoramento Ambiental/métodos , Metais/análise , Poluentes do Solo/análise , Espectroscopia de Luz Próxima ao Infravermelho/métodos , Silicatos de Alumínio/análise , Argila , Solo/química
2.
Sensors (Basel) ; 11(11): 10981-99, 2011.
Artigo em Inglês | MEDLINE | ID: mdl-22346683

RESUMO

In this article we describe a new instrumental setup at the University of Twente Faculty ITC with an optimized processing chain to measure absolute directional-hemispherical reflectance values of typical earth science samples in the 2.5 to 16 µm range. A Bruker Vertex 70 FTIR spectrometer was chosen as the base instrument. It was modified with an external integrating sphere with a 30 mm sampling port to allow measuring large, inhomogeneous samples and quantitatively compare the laboratory results to airborne and spaceborne remote sensing data. During the processing to directional-hemispherical reflectance values, a background radiation subtraction is performed, removing the effect of radiance not reflected from the sample itself on the detector. This provides more accurate reflectance values for low-reflecting samples. Repeat measurements taken over a 20 month period on a quartz sand standard show that the repeatability of the system is very high, with a standard deviation ranging between 0.001 and 0.006 reflectance units depending on wavelength. This high level of repeatability is achieved even after replacing optical components, re-aligning mirrors and placement of sample port reducers. Absolute reflectance values of measurements taken by the instrument here presented compare very favorably to measurements of other leading laboratories taken on identical sample standards.

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