RESUMO
The simultaneous and active feedback stabilization of X-ray beam position and monochromatic beam flux during EXAFS scans at the titanium K-edge as produced by a double-crystal monochromator beamline is reported. The feedback is generated using two independent feedback loops using separate beam flux and position measurements. The flux is stabilized using a fast extremum-searching algorithm that is insensitive to changes in the synchrotron ring current and energy-dependent monochromator output. Corrections of beam height are made using an innovative transmissive beam position monitor instrument. The efficacy of the feedback stabilization method is demonstrated by comparing the measurements of EXAFS spectra on inhomogeneous diluted Ti-containing samples with and without feedback applied.
RESUMO
Serial block-face electron microscopy with focused ion beam cutting suffers from cutting artefacts caused by changes in the relative position of beam and sample, which are, for example, inevitable when reconditioning the ion gun. The latter has to be done periodically, which limits the continuous stack-acquisition time to several days. Here, we describe a method for controlling the ion-beam position that is based on detecting that part of the ion beam that passes the sample (transmitted beam). We find that the transmitted-beam current decreases monotonically as the beam approaches the sample and can be used to determine the relative position of beam and sample to an accuracy of around one nanometre. By controlling the beam approach using this current as the feedback parameter, it is possible to ion-mill consecutive 5 nm slices without detectable variations in thickness even in the presence of substantial temperature fluctuations and to restart the acquisition of a stack seamlessly. In addition, the use of a silicon junction detector instead of the in-column detector is explored.