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Electronic Band Structures and Native Point Defects of Ultrafine ZnO Nanocrystals.
Zeng, Yu-Jia; Schouteden, Koen; Amini, Mozhgan N; Ruan, Shuang-Chen; Lu, Yang-Fan; Ye, Zhi-Zhen; Partoens, Bart; Lamoen, Dirk; Van Haesendonck, Chris.
Afiliação
  • Zeng YJ; †Shenzhen Key Laboratory of Laser Engineering, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, P. R. China.
  • Schouteden K; ‡Solid State Physics and Magnetism Section, KU Leuven, Celestijnenlaan 200 D, BE-3001 Leuven, Belgium.
  • Amini MN; ‡Solid State Physics and Magnetism Section, KU Leuven, Celestijnenlaan 200 D, BE-3001 Leuven, Belgium.
  • Lu YF; †Shenzhen Key Laboratory of Laser Engineering, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, P. R. China.
  • Ye ZZ; §State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, P. R. China.
  • Partoens B; §State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, P. R. China.
ACS Appl Mater Interfaces ; 7(19): 10617-22, 2015 May 20.
Article em En | MEDLINE | ID: mdl-25923131
ABSTRACT
Ultrafine ZnO nanocrystals with a thickness down to 0.25 nm are grown by a metalorganic chemical vapor deposition method. Electronic band structures and native point defects of ZnO nanocrystals are studied by a combination of scanning tunneling microscopy/spectroscopy and first-principles density functional theory calculations. Below a critical thickness of ∼1 nm ZnO adopts a graphitic-like structure and exhibits a wide band gap similar to its wurtzite counterpart. The hexagonal wurtzite structure, with a well-developed band gap evident from scanning tunneling spectroscopy, is established for a thickness starting from ∼1.4 nm. With further increase of the thickness to 2 nm, VO-VZn defect pairs are easily produced in ZnO nanocrystals due to the self-compensation effect in highly doped semiconductors.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Assunto da revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Ano de publicação: 2015 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Assunto da revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Ano de publicação: 2015 Tipo de documento: Article