Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement.
Rev Sci Instrum
; 86(5): 053903, 2015 May.
Article
em En
| MEDLINE
| ID: mdl-26026532
ABSTRACT
Electrons at surface may behave differently from those in bulk of a material. Multi-functional tools are essential in comprehensive studies on a crystal surface. Here, we developed an in situ microscopic four-point probe (4PP) transport measurement system on the basis of a scanning tunneling microscope (STM). In particular, convenient replacement between STM tips and micro-4PPs enables systematic investigations of surface morphology, electronic structure, and electrical transport property of a same sample surface. Performances of the instrument are demonstrated with high-quality STM images, tunneling spectra, and low-noise electrical I-V characteristic curves of a single-layer FeSe film grown on a conductive SrTiO3 surface.
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Coleções:
01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
Rev Sci Instrum
Ano de publicação:
2015
Tipo de documento:
Article
País de afiliação:
China