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Strain and Hole Gas Induced Raman Shifts in Ge-Si(x)Ge(1-x) Core-Shell Nanowires Using Tip-Enhanced Raman Spectroscopy.
Zhang, Zhongjian; Dillen, David C; Tutuc, Emanuel; Yu, Edward T.
Afiliação
  • Zhang Z; Microelectronics Research Center, University of Texas, 10100 Burnet Rd, Building 160, Austin, Texas 78758, United States.
  • Dillen DC; Microelectronics Research Center, University of Texas, 10100 Burnet Rd, Building 160, Austin, Texas 78758, United States.
  • Tutuc E; Microelectronics Research Center, University of Texas, 10100 Burnet Rd, Building 160, Austin, Texas 78758, United States.
  • Yu ET; Microelectronics Research Center, University of Texas, 10100 Burnet Rd, Building 160, Austin, Texas 78758, United States.
Nano Lett ; 15(7): 4303-10, 2015 Jul 08.
Article em En | MEDLINE | ID: mdl-26053999
ABSTRACT
We report tip-enhanced and conventional Raman spectroscopy studies of Ge-Si0.5Ge0.5 core-shell nanowires in which we observe two distinct Ge-Ge vibrational mode Raman peaks associated with vibrations in the Ge nanowire core and at the Ge-Si0.5Ge0.5 interface at which a quantum-confined hole gas is formed. Tip enhanced Raman measurements show dramatically increased sensitivity to the modes at the Ge-Si0.5Ge0.5 interface and a shift in position of this mode due to plasmonic field localization at the tip apex and the resulting change in phonon self-energy caused by increased coupling between phonons and intervalence-band carrier transitions.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2015 Tipo de documento: Article País de afiliação: Estados Unidos

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2015 Tipo de documento: Article País de afiliação: Estados Unidos