Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy.

Deng, Wenqi; Zhang, Guang-Ming; Murphy, Mark F; Lilley, Francis; Harvey, David M; Burton, David R

Deng, Wenqi; Zhang, Guang-Ming; Murphy, Mark F; Lilley, Francis; Harvey, David M; Burton, David R.

Afiliação

Deng W; General Engineering Research Institute, Liverpool John Moores University, Liverpool, L3 3AF, United Kingdom.
Zhang GM; General Engineering Research Institute, Liverpool John Moores University, Liverpool, L3 3AF, United Kingdom.
Murphy MF; General Engineering Research Institute, Liverpool John Moores University, Liverpool, L3 3AF, United Kingdom.
Lilley F; General Engineering Research Institute, Liverpool John Moores University, Liverpool, L3 3AF, United Kingdom.
Harvey DM; General Engineering Research Institute, Liverpool John Moores University, Liverpool, L3 3AF, United Kingdom.
Burton DR; General Engineering Research Institute, Liverpool John Moores University, Liverpool, L3 3AF, United Kingdom.

Microsc Res Tech ; 78(10): 935-46, 2015 Oct.

Article em En | MEDLINE | ID: mdl-26303510

Palavras-chave

dynamic response; finite element; phase shift; tapping mode AFM

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Revista: Microsc Res Tech Assunto da revista: DIAGNOSTICO POR IMAGEM Ano de publicação: 2015 Tipo de documento: Article País de afiliação: Reino Unido

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google