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Compensating the Degradation of Near-Infrared Absorption of Black Silicon Caused by Thermal Annealing.
Wang, Yanchao; Gao, Jinsong; Yang, Haigui; Wang, Xiaoyi; Shen, Zhenfeng.
Afiliação
  • Wang Y; University of the Chinese Academy of Sciences, Beijing, 100039, China.
  • Gao J; University of the Chinese Academy of Sciences, Beijing, 100039, China.
  • Yang H; Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China.
  • Wang X; Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China. yanghg@ciomp.ac.cn.
  • Shen Z; Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China.
Nanoscale Res Lett ; 11(1): 56, 2016 Dec.
Article em En | MEDLINE | ID: mdl-26831694

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanoscale Res Lett Ano de publicação: 2016 Tipo de documento: Article País de afiliação: China

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanoscale Res Lett Ano de publicação: 2016 Tipo de documento: Article País de afiliação: China