Novel silica stabilization method for the analysis of fine nanocrystals using coherent X-ray diffraction imaging.

Monteforte, Marianne; Estandarte, Ana K; Chen, Bo; Harder, Ross; Huang, Michael H; Robinson, Ian K

Monteforte, Marianne; Estandarte, Ana K; Chen, Bo; Harder, Ross; Huang, Michael H; Robinson, Ian K.

Afiliação

Monteforte M; London Centre for Nanotechnology, University College London, Gower Street, London WC1E 6BT, UK.
Estandarte AK; London Centre for Nanotechnology, University College London, Gower Street, London WC1E 6BT, UK.
Chen B; London Centre for Nanotechnology, University College London, Gower Street, London WC1E 6BT, UK.
Harder R; Argonne National Laboratory, Advanced Photon Source, Argonne, IL 60439, USA.
Huang MH; National Tsing Hua University, Guangfu Rd, East District, Hsinchu City 300, Taiwan.
Robinson IK; London Centre for Nanotechnology, University College London, Gower Street, London WC1E 6BT, UK.

J Synchrotron Radiat ; 23(Pt 4): 953-8, 2016 07.

Article em En | MEDLINE | ID: mdl-27359144

Palavras-chave

Bragg coherent X-ray diffraction; nanocrystals; stabilization method; strain; three-dimensional reconstruction

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Synchrotron Radiat Assunto da revista: RADIOLOGIA Ano de publicação: 2016 Tipo de documento: Article País de afiliação: Reino Unido

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