Depth-Profiling Electronic and Structural Properties of Cu(In,Ga)(S,Se)2 Thin-Film Solar Cell.

Chiang, Ching-Yu; Hsiao, Sheng-Wei; Wu, Pin-Jiun; Yang, Chu-Shou; Chen, Chia-Hao; Chou, Wu-Ching

Chiang, Ching-Yu; Hsiao, Sheng-Wei; Wu, Pin-Jiun; Yang, Chu-Shou; Chen, Chia-Hao; Chou, Wu-Ching.

Afiliação

Chiang CY; Institute and Department of Electrophysics, National Chiao Tung University , Hsinchu 30010, Taiwan.
Hsiao SW; National Synchrotron Radiation Research Center , Hsinchu 30076, Taiwan.
Wu PJ; Institute and Department of Electrophysics, National Chiao Tung University , Hsinchu 30010, Taiwan.
Yang CS; National Synchrotron Radiation Research Center , Hsinchu 30076, Taiwan.
Chen CH; Graduate Institute of Electro-Optical Engineering, Tatung University , Taipei 10452, Taiwan.
Chou WC; National Synchrotron Radiation Research Center , Hsinchu 30076, Taiwan.

ACS Appl Mater Interfaces ; 8(36): 24152-60, 2016 Sep 14.

Article em En | MEDLINE | ID: mdl-27505175

Palavras-chave

CIGSSe; band diagram; grazing-incidence X-ray powder diffraction (GIXRD); ordered defect compound (ODC); polishing; residual stress; scanning photoelectron microscope (SPEM); solar cell

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Assunto da revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Ano de publicação: 2016 Tipo de documento: Article País de afiliação: Taiwan

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google