High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography.

Hruszkewycz, S O; Allain, M; Holt, M V; Murray, C E; Holt, J R; Fuoss, P H; Chamard, V

Hruszkewycz, S O; Allain, M; Holt, M V; Murray, C E; Holt, J R; Fuoss, P H; Chamard, V.

Afiliação

Hruszkewycz SO; Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Allain M; Aix-Marseille University, CNRS, Centrale Marseille, Institut Fresnel, 13013 Marseille, France.
Holt MV; Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Murray CE; IBM T.J. Watson Research Center, Yorktown Heights, New York 10598, USA.
Holt JR; IBM Semiconductor Research and Development Center, Hopewell Junction, New York 12533, USA.
Fuoss PH; Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Chamard V; Aix-Marseille University, CNRS, Centrale Marseille, Institut Fresnel, 13013 Marseille, France.

Nat Mater ; 16(2): 244-251, 2017 02.

Article em En | MEDLINE | ID: mdl-27869823

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nat Mater Assunto da revista: CIENCIA / QUIMICA Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Estados Unidos

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