Boundary element method for 2D materials and thin films.

2D materials emerge as a viable platform for the control of light at the nanoscale. In this context the need has arisen for a fast and reliable tool capable of capturing their strictly 2D nature in 3D light scattering simulations. So far, 2D materials and their patterned structures (ribbons, discs, etc.) have been mostly treated as very thin films of subnanometer thickness with an effective dielectric function derived from their 2D optical conductivity. In this study an extension to the existing framework of the boundary element method (BEM) with 2D materials treated as a conductive interface between two media is presented. The testing of our enhanced method on problems with known analytical solutions reveals that for certain types of tasks the new modification is faster than the original BEM algorithm. Furthermore, the representation of 2D materials as an interface allows us to simulate problems in which their optical properties depend on spatial coordinates. Such spatial dependence can occur naturally or can be tailored artificially to attain new functional properties.