Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds.

Osborn, William A; McLean, Mark J; Bush, Brian

Osborn, William A; McLean, Mark J; Bush, Brian.

Afiliação

Osborn WA; Materials Measurement Science Division,National Institute of Standards and Technology,100 Bureau Drive, MS 8520,Gaithersburg, MD,USA.
McLean MJ; Materials Measurement Science Division,National Institute of Standards and Technology,100 Bureau Drive, MS 8520,Gaithersburg, MD,USA.
Bush B; Materials Measurement Science Division,National Institute of Standards and Technology,100 Bureau Drive, MS 8520,Gaithersburg, MD,USA.

Microsc Microanal ; 25(1): 77-79, 2019 02.

Article em En | MEDLINE | ID: mdl-30773153

Palavras-chave

EBID; EBSD; HR-EBSD; background; band contrast

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Estados Unidos

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