Generalized ellipsometry characterization of Ag nanorod arrays prepared by oblique angle deposition.

Ge, Bilin; Larson, Steven; Tu, Huatian; Zhao, Yiping; Fei, Yiyan

Ge, Bilin; Larson, Steven; Tu, Huatian; Zhao, Yiping; Fei, Yiyan.

Afiliação

Ge B; Department of Optical Science and Engineering, Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, Key Laboratory of Micro and Nano Photonic Structures (Ministry of Education), Fudan University, Shanghai, 200433, People's Republic of China.

Nanotechnology ; 31(7): 075705, 2020 Feb 07.

Article em En | MEDLINE | ID: mdl-31675750

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2020 Tipo de documento: Article

Texto completo

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2020 Tipo de documento: Article