Detection of Si doping in the AlN/GaN MQW using Super X - EDS measurements.

Sobczak, K; Borysiuk, J; Strak, P; Jakiela, R; Koronski, K; Kaminska, A; Monroy, E; Krukowski, S

Sobczak, K; Borysiuk, J; Strak, P; Jakiela, R; Koronski, K; Kaminska, A; Monroy, E; Krukowski, S.

Afiliação

Sobczak K; Faculty of Chemistry, Biological and Chemical Research Centre, University of Warsaw, 02089 Warsaw, Poland. Electronic address: ksobczak@cnbc.uw.edu.pl.
Borysiuk J; Faculty of Physics, University of Warsaw, Pasteura 5, 02093 Warsaw, Poland.
Strak P; Institute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw, Poland.
Jakiela R; Institute of Physics Polish Academy of Sciences, Al. Lotnikow 32/46, 01-142 Warsaw, Poland.
Koronski K; Institute of Physics Polish Academy of Sciences, Al. Lotnikow 32/46, 01-142 Warsaw, Poland.
Kaminska A; Institute of Physics Polish Academy of Sciences, Al. Lotnikow 32/46, 01-142 Warsaw, Poland; Cardinal Stefan Wyszynski University, Faculty of Mathematics and Natural Sciences, School of Exact Sciences, Dewajtis 5, 01-815 Warsaw, Poland.
Monroy E; Universite Grenoble-Alpes, CEA Grenoble, INAC-PHELIQS, 17 av. des Martyrs, 38000 Grenoble, France.
Krukowski S; Institute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw, Poland.

Micron ; 134: 102864, 2020 Jul.

Article em En | MEDLINE | ID: mdl-32251927

Palavras-chave

Multiple-quantum-well; Nitrides; Si doping

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Micron Assunto da revista: DIAGNOSTICO POR IMAGEM Ano de publicação: 2020 Tipo de documento: Article

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