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Analysing quantized resistance behaviour in graphene Corbino p-n junction devices.
Liu, Chieh-I; Scaletta, Dominick S; Patel, Dinesh K; Kruskopf, Mattias; Levy, Antonio; Hill, Heather M; Rigosi, Albert F.
Afiliação
  • Liu CI; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Scaletta DS; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD 20742, United States.
  • Patel DK; Department of Physics, Mount San Jacinto College, Menifee, CA 92584, United States.
  • Kruskopf M; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Levy A; Department of Physics, National Taiwan University, Taipei 10617, Taiwan.
  • Hill HM; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Rigosi AF; Joint Quantum Institute, University of Maryland, College Park, MD 20742, United States.
J Phys D Appl Phys ; 53(27)2020.
Article em En | MEDLINE | ID: mdl-32831402
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Phys D Appl Phys Ano de publicação: 2020 Tipo de documento: Article País de afiliação: Estados Unidos
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Phys D Appl Phys Ano de publicação: 2020 Tipo de documento: Article País de afiliação: Estados Unidos