Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology.

Jones, Adam; Uggalla, Leshan; Li, Kang; Fan, Yuanlong; Willow, Ashley; Mills, Christopher A; Copner, Nigel

Jones, Adam; Uggalla, Leshan; Li, Kang; Fan, Yuanlong; Willow, Ashley; Mills, Christopher A; Copner, Nigel.

Afiliação

Jones A; Wireless and Optoelectronic Research and Innovation Centre, University of South Wales, Treforest CF37 1DL, UK.
Uggalla L; Wireless and Optoelectronic Research and Innovation Centre, University of South Wales, Treforest CF37 1DL, UK.
Li K; Wireless and Optoelectronic Research and Innovation Centre, University of South Wales, Treforest CF37 1DL, UK.
Fan Y; Wireless and Optoelectronic Research and Innovation Centre, University of South Wales, Treforest CF37 1DL, UK.
Willow A; Tata Steel, Research and Development, Swansea Technology Centre, Swansea SA2 8PP, UK.
Mills CA; Tata Steel, Research and Development, Swansea Technology Centre, Swansea SA2 8PP, UK.
Copner N; Wireless and Optoelectronic Research and Innovation Centre, University of South Wales, Treforest CF37 1DL, UK.

Sensors (Basel) ; 21(10)2021 May 11.

Article em En | MEDLINE | ID: mdl-34064984

Palavras-chave

chromium; coating thickness measurement; optical metrology; steel substrate

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2021 Tipo de documento: Article País de afiliação: Reino Unido

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