An application of a Si/CdTe Compton camera for the polarization measurement of hard x rays from highly charged heavy ions.

Tsuzuki, Yutaka; Watanabe, Shin; Oishi, Shimpei; Nakamura, Nobuyuki; Numadate, Naoki; Odaka, Hirokazu; Uchida, Yuusuke; Yoneda, Hiroki; Takahashi, Tadayuki

Tsuzuki, Yutaka; Watanabe, Shin; Oishi, Shimpei; Nakamura, Nobuyuki; Numadate, Naoki; Odaka, Hirokazu; Uchida, Yuusuke; Yoneda, Hiroki; Takahashi, Tadayuki.

Afiliação

Tsuzuki Y; Department of Physics, The University of Tokyo, 7-3-1, Hongo, Bunkyo, Tokyo 113-0033, Japan.
Watanabe S; Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency, 3-1-1 Yoshinodai, Chuo Sagamihara, Kanagawa 252-5210, Japan.
Oishi S; Institute for Laser Science, The University of Electro-Communications, Chofu, Tokyo 182-8585, Japan.
Nakamura N; Institute for Laser Science, The University of Electro-Communications, Chofu, Tokyo 182-8585, Japan.
Numadate N; Komaba Institute for Science, The University of Tokyo, 3-8-1 Komaba, Meguro, Tokyo 153-8902, Japan.
Odaka H; Department of Physics, The University of Tokyo, 7-3-1, Hongo, Bunkyo, Tokyo 113-0033, Japan.
Uchida Y; Department of Physics, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima, Hiroshima 739-8526, Japan.
Yoneda H; RIKEN Nishina Center, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan.
Takahashi T; Kavli Institute for the Physics and Mathematics of the Universe (WPI), Institutes for Advanced Study (UTIAS), The University of Tokyo, 5-1-5 Kashiwa-no-Ha, Kashiwa, Chiba 277-8583, Japan.

Rev Sci Instrum ; 92(6): 063101, 2021 Jun 01.

Article em En | MEDLINE | ID: mdl-34243506

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2021 Tipo de documento: Article País de afiliação: Japão

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