Mathematical estimation of half-value layer thicknesses.

Omoumi, Farid H; Wu, Xizeng; Ghani, Muhammad U; Wong, Molly D; Li, Yuhua; Liu, Hong

Omoumi, Farid H; Wu, Xizeng; Ghani, Muhammad U; Wong, Molly D; Li, Yuhua; Liu, Hong.

Afiliação

Omoumi FH; The School of Electrical and Computer Engineering, The University of Oklahoma, Norman, Oklahoma, USA.
Wu X; Department of Radiology, University of Alabama at Birmingham, Birmingham, Alabama, USA.
Ghani MU; The School of Electrical and Computer Engineering, The University of Oklahoma, Norman, Oklahoma, USA.
Wong MD; The School of Electrical and Computer Engineering, The University of Oklahoma, Norman, Oklahoma, USA.
Li Y; The School of Electrical and Computer Engineering, The University of Oklahoma, Norman, Oklahoma, USA.
Liu H; The School of Electrical and Computer Engineering, The University of Oklahoma, Norman, Oklahoma, USA.

J Appl Clin Med Phys ; 22(10): 320-328, 2021 Oct.

Article em En | MEDLINE | ID: mdl-34469057

Assuntos

Compostos de Cádmio; Pontos Quânticos; Humanos; Telúrio; Raios X

Palavras-chave

half-value layer; quarter-value layer; tenth-value layer; x-ray spectrum

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Compostos de Cádmio / Pontos Quânticos Limite: Humans Idioma: En Revista: J Appl Clin Med Phys Assunto da revista: BIOFISICA Ano de publicação: 2021 Tipo de documento: Article País de afiliação: Estados Unidos

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