Cost and Capability Compromises in STEM Instrumentation for Low-Voltage Imaging.

Quigley, Frances; McBean, Patrick; O'Donovan, Peter; Peters, Jonathan J P; Jones, Lewys

Quigley, Frances; McBean, Patrick; O'Donovan, Peter; Peters, Jonathan J P; Jones, Lewys.

Afiliação

Quigley F; School of Physics, Trinity College Dublin, Dublin 2, Ireland.
McBean P; Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures & Nanodevices (CRANN), Dublin 2, Ireland.
O'Donovan P; School of Physics, Trinity College Dublin, Dublin 2, Ireland.
Peters JJP; Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures & Nanodevices (CRANN), Dublin 2, Ireland.
Jones L; School of Physics, Trinity College Dublin, Dublin 2, Ireland.

Microsc Microanal ; : 1-7, 2022 Mar 31.

Article em En | MEDLINE | ID: mdl-35354509

Palavras-chave

chromatic aberration; image simulation; low-voltage imaging; monochromation; scanning transmission electron microscope (STEM)

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Health_economic_evaluation Idioma: En Revista: Microsc Microanal Ano de publicação: 2022 Tipo de documento: Article País de afiliação: Irlanda

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