Learning Atom Probe Tomography time-of-flight peaks for mass-to-charge ratio spectrometry.

Coakley, Kevin J; Sanford, Norman A

Coakley, Kevin J; Sanford, Norman A.

Afiliação

Coakley KJ; National Institute of Standards and Technology, 325 Broadway, Boulder CO 80305, USA. Electronic address: kevin.coakley@nist.gov.
Sanford NA; National Institute of Standards and Technology, 325 Broadway, Boulder CO 80305, USA. Electronic address: norman.sanford@nist.gov.

Ultramicroscopy ; 237: 113521, 2022 Jul.

Article em En | MEDLINE | ID: mdl-35452870

Palavras-chave

Atom Probe Tomography; Cross-validation; Expectation Maximization algorithm; Machine learning; Maximum likelihood; Mixture model; Silicon isotopes

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2022 Tipo de documento: Article

Texto completo

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PubMed Links

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2022 Tipo de documento: Article