Disentangling Tilt and Polarization Measurements in 4D-STEM Measurements of a Multilayer by Inversion of a Stacked Bloch Wave Model.

Zeltmann, Steven E; Hsu, Shang-Lin; Brown, Hamish G; Susarla, Sandhya; Minor, Andrew; Ophus, Colin

Zeltmann, Steven E; Hsu, Shang-Lin; Brown, Hamish G; Susarla, Sandhya; Minor, Andrew; Ophus, Colin.

Afiliação

Zeltmann SE; Department of Materials Science and Engineering, University of California, Berkeley, United States.
Hsu SL; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA, United States.
Brown HG; Ian Holmes Imaging Centre, Bio21 Molecular Science and Biotechnology Institute, University of Melbourne, Victoria, Australia.
Susarla S; School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, AZ, United States.
Minor A; Department of Materials Science and Engineering, University of California, Berkeley, United States.
Ophus C; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States.

Microsc Microanal ; 29(Supplement_1): 256-257, 2023 Jul 22.

Article em En | MEDLINE | ID: mdl-37613246

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos

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