Probing Single In-Donor Emitter Sites in ZnO: Ion-Beam Processing to Overcome Diffraction-Limited Optical Measurements.

Matthews, Bethany E; Zimmermann, Christian; Hansen, Ethan; Niaouris, Vasileios; Fu, Kai-Mei; Spurgeon, Steven R

Matthews, Bethany E; Zimmermann, Christian; Hansen, Ethan; Niaouris, Vasileios; Fu, Kai-Mei; Spurgeon, Steven R.

Afiliação

Matthews BE; Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland, WA, United States.
Zimmermann C; Department of Physics, University of Washington, Seattle, WA, United States.
Hansen E; Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland, WA, United States.
Niaouris V; Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland, WA, United States.
Fu KM; Department of Physics, University of Washington, Seattle, WA, United States.
Spurgeon SR; Department of Electrical and Computer Engineering, University of Washington, Seattle, WA, United States.

Microsc Microanal ; 29(Supplement_1): 1823-1824, 2023 Jul 22.

Article em En | MEDLINE | ID: mdl-37613853

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos

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