In Situ Sputtering From the Micromanipulator to Enable Cryogenic Preparation of Specimens for Atom Probe Tomography by Focused-Ion Beam.

Douglas, James O; Conroy, Michele; Giuliani, Finn; Gault, Baptiste

Douglas, James O; Conroy, Michele; Giuliani, Finn; Gault, Baptiste.

Afiliação

Douglas JO; Department of Materials, Royal School of Mines, Imperial College London, Prince Consort Road, London SW7 2BP, UK.
Conroy M; Department of Materials, Royal School of Mines, Imperial College London, Prince Consort Road, London SW7 2BP, UK.
Giuliani F; Department of Materials, Royal School of Mines, Imperial College London, Prince Consort Road, London SW7 2BP, UK.
Gault B; Department of Materials, Royal School of Mines, Imperial College London, Prince Consort Road, London SW7 2BP, UK.

Microsc Microanal ; 29(3): 1009-1017, 2023 Jun 09.

Article em En | MEDLINE | ID: mdl-37749683

Palavras-chave

in situ sputtering; atom probe tomography; cryogenic preparation; focused-ion beam

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Reino Unido

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google