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Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 µm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.
Chao, Calvin Yi-Ping; Wu, Thomas Meng-Hsiu; Yeh, Shang-Fu; Lee, Chih-Lin; Tu, Honyih; Huang, Joey Chiao-Yi; Chang, Chin-Hao.
Afiliação
  • Chao CY; Taiwan Semiconductor Manufacturing Company (TSMC), Hsinchu 30077, Taiwan.
  • Wu TM; Taiwan Semiconductor Manufacturing Company (TSMC), Hsinchu 30077, Taiwan.
  • Yeh SF; Taiwan Semiconductor Manufacturing Company (TSMC), Hsinchu 30077, Taiwan.
  • Lee CL; Taiwan Semiconductor Manufacturing Company (TSMC), Hsinchu 30077, Taiwan.
  • Tu H; Taiwan Semiconductor Manufacturing Company (TSMC), Hsinchu 30077, Taiwan.
  • Huang JC; Taiwan Semiconductor Manufacturing Company (TSMC), Hsinchu 30077, Taiwan.
  • Chang CH; Taiwan Semiconductor Manufacturing Company (TSMC), Hsinchu 30077, Taiwan.
Sensors (Basel) ; 23(18)2023 Sep 18.
Article em En | MEDLINE | ID: mdl-37766015
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Clinical_trials Idioma: En Revista: Sensors (Basel) Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Taiwan
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Clinical_trials Idioma: En Revista: Sensors (Basel) Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Taiwan