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Magnetic field observation in a magnetic tunnel junction by scanning transmission electron microscopy.
Kohno, Yuji; Seki, Takehito; Tsuruoka, Shun; Ohya, Shinobu; Shibata, Naoya.
Afiliação
  • Kohno Y; JEOL Ltd, 3-1-2, Musashino, Akishima, Tokyo 196-8558, Japan.
  • Seki T; Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Yayoi 2-11-16, Bunkyo-ku, Tokyo 113-8656, Japan.
  • Tsuruoka S; PRESTO, Japan Science and Technology Agency, Honcho 4-1-8, Kawaguchi, Saitama 332-0012, Japan.
  • Ohya S; Department of Electrical Engineering and Information Systems, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan.
  • Shibata N; Department of Electrical Engineering and Information Systems, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan.
Microscopy (Oxf) ; 73(4): 329-334, 2024 Jul 30.
Article em En | MEDLINE | ID: mdl-38155605
ABSTRACT
A magnetic tunnel junction (MTJ) consists of two ferromagnetic layers separated by a thin insulating layer. MTJs show tunnel magnetoresistance effect, where the resistance in the direction perpendicular to the insulator layer drastically changes depending on the magnetization directions (parallel or antiparallel) in the ferromagnetic layers. However, direct observation of local magnetizations inside MTJs has been challenging. In this study, we demonstrate direct observation of magnetic flux density distribution inside epitaxially grown Fe/MgO/Fe layers using differential phase contrast scanning transmission electron microscopy. By utilizing newly developed tilt-scan averaging system for suppressing diffraction contrasts, we clearly visualize parallel and antiparallel states of ferromagnetic layers at nanometer resolution.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microscopy (Oxf) Ano de publicação: 2024 Tipo de documento: Article País de afiliação: Japão

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microscopy (Oxf) Ano de publicação: 2024 Tipo de documento: Article País de afiliação: Japão