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Polarimeters for the Detection of Anisotropy from Reflectance.
Kamegaki, Shuji; Khajehsaeidimahabadi, Zahra; Ryu, Meguya; Le, Nguyen Hoai An; Ng, Soon Hock; Buividas, Ricardas; Seniutinas, Gediminas; Anand, Vijayakumar; Juodkazis, Saulius; Morikawa, Junko.
Afiliação
  • Kamegaki S; School of Materials and Chemical Technology, Tokyo Institute of Technology, Ookayama, Meguro-ku, Tokyo 152-8550, Japan.
  • Khajehsaeidimahabadi Z; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia.
  • Ryu M; Aerostructures Innovation Research Hub (AIR Hub), Swinburne University of Technology, John St, Hawthorn, VIC 3122, Australia.
  • Le NHA; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba 305-8563, Ibaraki, Japan.
  • Ng SH; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia.
  • Buividas R; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia.
  • Seniutinas G; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia.
  • Anand V; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia.
  • Juodkazis S; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia.
  • Morikawa J; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia.
Micromachines (Basel) ; 15(6)2024 Jun 17.
Article em En | MEDLINE | ID: mdl-38930764
ABSTRACT
Polarimetry is used to determine the Stokes parameters of a laser beam. Once all four S0,1,2,3 parameters are determined, the state of polarisation is established. Upon reflection of a laser beam with the defined S polarisation state, the directly measured S parameters can be used to determine the optical properties of the surface, which modify the S-state upon reflection. Here, we use polarimetry for the determination of surface anisotropies related to the birefringence and dichroism of different materials, which have a common feature of linear patterns with different alignments and scales. It is shown that polarimetry in the back-reflected light is complementary to ellipsometry and four-polarisation camera imaging; experiments were carried out using a microscope.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Micromachines (Basel) Ano de publicação: 2024 Tipo de documento: Article País de afiliação: Japão

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Micromachines (Basel) Ano de publicação: 2024 Tipo de documento: Article País de afiliação: Japão