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1.
Microsc Res Tech ; 70(6): 547-53, 2007 Jun.
Artículo en Inglés | MEDLINE | ID: mdl-17479982

RESUMEN

Self-ordering growth of nanoarrays on strained metallic interfaces is an attractive option for preparing highly ordered nanotemplates. The great potential of this natural templating approach is that symmetry, feature sizes, and density are predicted to depend on the interfacial stress in these strained layers, which can be adjusted by changing the substrate-thin film composition, temperature, and adlayer coverage. This bottom-up approach of growing nanostructured two-dimensional ordered arrays of clusters on the misfit dislocation networks of strained metallic thin films and surfaces requires a detailed understanding of the nucleation and film-adsorbate interaction processes. Here we show how high resolution, large scale, variable temperature scanning tunneling microscopy imaging can improve our understanding of these self-assembly processes.

2.
Rev Sci Instrum ; 78(10): 103701, 2007 Oct.
Artículo en Inglés | MEDLINE | ID: mdl-17979422

RESUMEN

We describe the design and performance of a fast-scanning, variable temperature scanning tunneling microscope (STM) operating from 80 to 700 K in ultrahigh vacuum (UHV), which routinely achieves large scale atomically resolved imaging of compact metallic surfaces. An efficient in-vacuum vibration isolation and cryogenic system allows for no external vibration isolation of the UHV chamber. The design of the sample holder and STM head permits imaging of the same nanometer-size area of the sample before and after sample preparation outside the STM base. Refractory metal samples are frequently annealed up to 2000 K and their cooldown time from room temperature to 80 K is 15 min. The vertical resolution of the instrument was found to be about 2 pm at room temperature. The coarse motor design allows both translation and rotation of the scanner tube. The total scanning area is about 8 x 8 microm(2). The sample temperature can be adjusted by a few tens of degrees while scanning over the same sample area.


Asunto(s)
Aumento de la Imagen/instrumentación , Interpretación de Imagen Asistida por Computador/instrumentación , Microscopía de Túnel de Rastreo/instrumentación , Manejo de Especímenes/instrumentación , Diseño de Equipo , Análisis de Falla de Equipo , Microscopía de Túnel de Rastreo/métodos , Reproducibilidad de los Resultados , Sensibilidad y Especificidad , Manejo de Especímenes/métodos , Temperatura , Vacio
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