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Space Sci Rev ; 212(1-2): 645-654, 2017 Oct.
Artículo en Inglés | MEDLINE | ID: mdl-30034035

RESUMEN

The NASA Ionospheric Connection Explorer Extreme Ultraviolet spectrograph, ICON EUV, will measure altitude profiles of the daytime extreme-ultraviolet (EUV) OII emission near 83.4 and 61.7 nm that are used to determine density profiles and state parameters of the ionosphere. This paper describes the algorithm concept and approach to inverting these measured OII emission profiles to derive the associated O+ density profile from 150-450 km as a proxy for the electron content in the F-region of the ionosphere. The algorithm incorporates a bias evaluation and feedback step, developed at the U.S. Naval Research Laboratory using data from the Special Sensor Ultraviolet Limb Imager (SSULI) and the Remote Atmospheric and Ionospheric Detection System (RAIDS) missions, that is able to effectively mitigate the effects of systematic instrument calibration errors and inaccuracies in the original photon source within the forward model. Results are presented from end-to-end simulations that convolved simulated airglow profiles with the expected instrument measurement response to produce profiles that were inverted with the algorithm to return data products for comparison to truth. Simulations of measurements over a representative ICON orbit show the algorithm is able to reproduce hmF2 values to better than 5 km accuracy, and NmF2 to better than 12% accuracy over a 12-second integration, and demonstrate that the ICON EUV instrument and daytime ionosphere algorithm can meet the ICON science objectives which require 20 km vertical resolution in hmF2 and 18% precision in NmF2.

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