Silicon oxide nanowire growth mechanisms revealed by real-time electron microscopy.

Kolíbal, Miroslav; Novák, Libor; Shanley, Toby; Toth, Milos; Sikola, Tomás

Kolíbal, Miroslav; Novák, Libor; Shanley, Toby; Toth, Milos; Sikola, Tomás.

Afiliación

Kolíbal M; Institute of Physical Engineering, Brno University of Technology, Technická 2, 616 69 Brno, Czech Republic and CEITEC BUT, Brno University of Technology, Technická 10, 61669 Brno, Czech Republic.
Novák L; FEI Company, Vlastimila Pecha 1282/12, 627 00 Brno, Czech Republic. kolibal.m@fme.vutbr.cz.
Shanley T; School of Mathematical and Physical Sciences, University of Technology, Sydney, Ultimo 2007, Australia.
Toth M; School of Mathematical and Physical Sciences, University of Technology, Sydney, Ultimo 2007, Australia.
Sikola T; Institute of Physical Engineering, Brno University of Technology, Technická 2, 616 69 Brno, Czech Republic and CEITEC BUT, Brno University of Technology, Technická 10, 61669 Brno, Czech Republic.

Nanoscale ; 8(1): 266-75, 2016 Jan 07.

Article en En | MEDLINE | ID: mdl-26608729

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Nanoscale Año: 2016 Tipo del documento: Article País de afiliación: República Checa

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