X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La2Zr2O7 Buffer Layer Capacity.

Narayanan, Vyshnavi; de Buysser, Klaartje; Bruneel, Els; Driessche, Isabel van

Narayanan, Vyshnavi; de Buysser, Klaartje; Bruneel, Els; Driessche, Isabel van.

Afiliación

Narayanan V; Sol-Gel Centre for Research on Inorganic Powders and Thin Film Synthesis SCRiPTS, Department of Inorganic and Physical Chemistry, Ghent University, Krijgslaan 281-S3, Gent B-9000, Belgium. vyshnavi.narayanan@ugent.be.
de Buysser K; Sol-Gel Centre for Research on Inorganic Powders and Thin Film Synthesis SCRiPTS, Department of Inorganic and Physical Chemistry, Ghent University, Krijgslaan 281-S3, Gent B-9000, Belgium. klaartje.debuysser@ugent.be.
Bruneel E; Sol-Gel Centre for Research on Inorganic Powders and Thin Film Synthesis SCRiPTS, Department of Inorganic and Physical Chemistry, Ghent University, Krijgslaan 281-S3, Gent B-9000, Belgium. els.bruneel@ugent.be.
Driessche IV; Sol-Gel Centre for Research on Inorganic Powders and Thin Film Synthesis SCRiPTS, Department of Inorganic and Physical Chemistry, Ghent University, Krijgslaan 281-S3, Gent B-9000, Belgium. isabel.vandriessche@ugent.be.

Materials (Basel) ; 5(3): 364-376, 2012 Feb 27.

Article en En | MEDLINE | ID: mdl-28817051

Palabras clave

X-ray photoelectron spectroscopy; buffer layers; chemical solution deposition; coated conductor; depth profile

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Materials (Basel) Año: 2012 Tipo del documento: Article País de afiliación: Bélgica

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