Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis.

Uluutku, Berkin; Solares, Santiago D

Uluutku, Berkin; Solares, Santiago D.

Afiliación

Uluutku B; The George Washington University, Department of Mechanical and Aerospace Engineering, 800 22nd St. NW, Suite 3000, Washington, DC 20052, USA.
Solares SD; The George Washington University, Department of Mechanical and Aerospace Engineering, 800 22nd St. NW, Suite 3000, Washington, DC 20052, USA.

Beilstein J Nanotechnol ; 11: 453-465, 2020.

Article en En | MEDLINE | ID: mdl-32215233

Palabras clave

Fourier analysis; atomic force microscopy (AFM); conductivity; current; intermittent contact; tapping-mode AFM

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Beilstein J Nanotechnol Año: 2020 Tipo del documento: Article País de afiliación: Estados Unidos

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