Your browser doesn't support javascript.
loading
Trial and error: A hierarchical modeling approach to test-retest reliability.
Chen, Gang; Pine, Daniel S; Brotman, Melissa A; Smith, Ashley R; Cox, Robert W; Haller, Simone P.
Afiliación
  • Chen G; Scientific and Statistical Computing Core, National Institute of Mental Health, USA. Electronic address: gangchen@mail.nih.gov.
  • Pine DS; Section on Development and Affective Neuroscience, National Institute of Mental Health, USA.
  • Brotman MA; Neuroscience and Novel Therapeutics Unit, Emotion and Development Branch, National Institute of Mental Health, USA.
  • Smith AR; Section on Development and Affective Neuroscience, National Institute of Mental Health, USA.
  • Cox RW; Scientific and Statistical Computing Core, National Institute of Mental Health, USA.
  • Haller SP; Neuroscience and Novel Therapeutics Unit, Emotion and Development Branch, National Institute of Mental Health, USA.
Neuroimage ; 245: 118647, 2021 12 15.
Article en En | MEDLINE | ID: mdl-34688897

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Asunto principal: Imagen por Resonancia Magnética / Neuroimagen Tipo de estudio: Prognostic_studies / Risk_factors_studies Límite: Humans Idioma: En Revista: Neuroimage Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2021 Tipo del documento: Article

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Asunto principal: Imagen por Resonancia Magnética / Neuroimagen Tipo de estudio: Prognostic_studies / Risk_factors_studies Límite: Humans Idioma: En Revista: Neuroimage Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2021 Tipo del documento: Article