Electrostatically Controllable Channel Thickness and Tunable Low-Frequency Noise Characteristics of Double-Gated Multilayer MoS2 Field-Effect Transistors with h-BN Dielectric.
ACS Appl Mater Interfaces
; 14(22): 25763-25769, 2022 Jun 08.
Article
en En
| MEDLINE
| ID: mdl-35617622
ABSTRACT
Two-dimensional transition-metal dichalcogenide (TMD) materials have attracted increasing attention in efforts to overcome fundamental issues faced by the complementary metal-oxide-semiconductor industry. Multilayer TMD materials such as MoS2 can be used for high-performance transistor-based applications; the drive currents are high and the materials handle low-frequency (LF) noise well. We fabricated double-gated multilayer MoS2 transistors using the h-BN dielectric for the top gate and silicon dioxide for the bottom gate. We systemically investigated the bottom gate voltage (Vb)-controlled electrical characteristics and the top/bottom interface-coupling effects. The effective thickness of the MoS2 channel (tMoS2_eff) was well modulated by Vb, and tMoS2_eff reduction by negative Vb dramatically improved the Ion/Ioff ratio. Numerical simulation and analytical modeling with a variation of the depletion depth under different bias conditions verified the experimental results. We were also the first to observe Vb-tuned LF noise characteristics. Here, we discuss the Vb-affected series resistance and carrier mobility in detail. Our findings greatly enhance the understanding of how double-gated multilayer MoS2 transistors operate and will facilitate performance optimization in the real world.
Texto completo:
1
Colección:
01-internacional
Banco de datos:
MEDLINE
Tipo de estudio:
Prognostic_studies
Idioma:
En
Revista:
ACS Appl Mater Interfaces
Asunto de la revista:
BIOTECNOLOGIA
/
ENGENHARIA BIOMEDICA
Año:
2022
Tipo del documento:
Article
País de afiliación:
Corea del Sur