Machine Intelligence-Centered System for Automated Characterization of Functional Materials and Interfaces.

Muckley, Eric S; Vasudevan, Rama; Sumpter, Bobby G; Advincula, Rigoberto C; Ivanov, Ilia N

Muckley, Eric S; Vasudevan, Rama; Sumpter, Bobby G; Advincula, Rigoberto C; Ivanov, Ilia N.

Afiliación

Muckley ES; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, United States.
Vasudevan R; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, United States.
Sumpter BG; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, United States.
Advincula RC; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, United States.
Ivanov IN; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831, United States.

ACS Appl Mater Interfaces ; 15(1): 2329-2340, 2023 Jan 11.

Article en En | MEDLINE | ID: mdl-36577139

Palabras clave

autonomous experiment; impedance; machine learning; quartz crystal microbalance; sensors; thin-film characterization

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos

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