Electrically Controlled Bimetallic Junctions for Atomic-Scale Electronics.

Singh, Anil Kumar; Chakrabarti, Sudipto; Vilan, Ayelet; Smogunov, Alexander; Tal, Oren

Singh, Anil Kumar; Chakrabarti, Sudipto; Vilan, Ayelet; Smogunov, Alexander; Tal, Oren.

Afiliación

Singh AK; Department of Chemical and Biological Physics, Weizmann Institute of Science, Rehovot 7610001, Israel.
Chakrabarti S; Department of Chemical and Biological Physics, Weizmann Institute of Science, Rehovot 7610001, Israel.
Vilan A; Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, Kolkata 700064, India.
Smogunov A; Department of Chemical and Biological Physics, Weizmann Institute of Science, Rehovot 7610001, Israel.
Tal O; SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, Gif sur Yvette 91191, France.

Nano Lett ; 23(17): 7775-7781, 2023 Sep 13.

Article en En | MEDLINE | ID: mdl-37603598

Palabras clave

alloy; atomic chain; atomic contact; break junction; electromigration; molecular junction

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2023 Tipo del documento: Article País de afiliación: Israel

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