AFM study of hippocampal cells cultured on silicon wafers with nano-scale surface topograph.
Colloids Surf B Biointerfaces
; 44(2-3): 152-7, 2005 Aug.
Article
em En
| MEDLINE
| ID: mdl-16054346
ABSTRACT
The rat hippocampal cells were selected as model to study the interaction between the neural cells and silicon substrates using atomic force microscopy (AFM). The hippocampal cells show tight adherence on silicon wafers with nano-scale surface topograph. The lateral friction force investigated by AFM shows significant increase on the boundary around the cellular body. It is considered to relate to the cytoskeleton and cellular secretions. After ultrasonic wash in ethanol and acetone step by step, the surface of silicon wafers was observed by AFM sequentially. We have found that the culture leftovers form tight porous networks and a monolayer on the silicon wafers. It is concluded that the leftovers overspreading on the silicon substrates are the base of cell adherence on such smooth inert surfaces.
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Coleções:
01-internacional
Base de dados:
MEDLINE
Assunto principal:
Silício
/
Microscopia de Força Atômica
/
Hipocampo
Limite:
Animals
Idioma:
En
Revista:
Colloids Surf B Biointerfaces
Assunto da revista:
QUIMICA
Ano de publicação:
2005
Tipo de documento:
Article