Interferometric measurement of the temperature dependence of an index of refraction: application to fused silica.
Appl Opt
; 49(4): 678-82, 2010 Feb 01.
Article
em En
| MEDLINE
| ID: mdl-20119019
ABSTRACT
The light reflected by an uncoated Fabry-Perot etalon presents dark rings which give a very sensitive measurement of the variations of the return optical path in the etalon. By measuring the diameters of these rings as a function of the etalon temperature T, we get a sensitive measurement of the derivative dn/dT of the index of refraction n. We have made this experiment with a fused silica etalon and we have achieved a 2% relative uncertainty on dn/dT, comparable to the uncertainty of the best experiments.
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Coleções:
01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
Appl Opt
Ano de publicação:
2010
Tipo de documento:
Article
País de afiliação:
França