Transition from silicene monolayer to thin Si films on Ag(111): comparison between experimental data and Monte Carlo simulation.

Curcella, Alberto; Bernard, Romain; Borensztein, Yves; Pandolfi, Silvia; Prévot, Geoffroy

Curcella, Alberto; Bernard, Romain; Borensztein, Yves; Pandolfi, Silvia; Prévot, Geoffroy.

Afiliação

Curcella A; Sorbonne Universités, UPMC Univ Paris 06, CNRS-UMR 7588, Institut des NanoSciences de Paris, F-75005, Paris, France.
Bernard R; Sorbonne Universités, UPMC Univ Paris 06, CNRS-UMR 7588, Institut des NanoSciences de Paris, F-75005, Paris, France.
Borensztein Y; Sorbonne Universités, UPMC Univ Paris 06, CNRS-UMR 7588, Institut des NanoSciences de Paris, F-75005, Paris, France.
Pandolfi S; Sorbonne Universités, UPMC Univ Paris 06, CNRS-UMR 7588, Institut des NanoSciences de Paris, F-75005, Paris, France.
Prévot G; Sorbonne Universités, UPMC Univ Paris 06, CNRS-UMR 7588, Institut des NanoSciences de Paris, F-75005, Paris, France.

Beilstein J Nanotechnol ; 9: 48-56, 2018.

Article em En | MEDLINE | ID: mdl-29379700

Palavras-chave

Auger electron spectroscopy; scanning tunneling microscopy; silicene; silicon; silver

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Beilstein J Nanotechnol Ano de publicação: 2018 Tipo de documento: Article País de afiliação: França

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