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Quantitative characterization of high temperature oxidation using electron tomography and energy-dispersive X-ray spectroscopy.
Zhou, Jihan; Taylor, Matthew; Melinte, Georgian A; Shahani, Ashwin J; Dharmawardhana, Chamila C; Heinz, Hendrik; Voorhees, Peter W; Perepezko, John H; Bustillo, Karen; Ercius, Peter; Miao, Jianwei.
Afiliação
  • Zhou J; Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, 90095, USA.
  • Taylor M; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA.
  • Melinte GA; Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, 90095, USA.
  • Shahani AJ; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109, USA.
  • Dharmawardhana CC; Department of Chemical and Biological Engineering, University of Colorado, Boulder, CO, 80303, USA.
  • Heinz H; Department of Chemical and Biological Engineering, University of Colorado, Boulder, CO, 80303, USA.
  • Voorhees PW; Department of Materials Science and Engineering, Department of Engineering Sciences and Applied Mathematics, Northwestern University, Evanston, IL, 60208, USA.
  • Perepezko JH; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA.
  • Bustillo K; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
  • Ercius P; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
  • Miao J; Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, 90095, USA. miao@physics.ucla.edu.
Sci Rep ; 8(1): 10239, 2018 Jul 06.
Article em En | MEDLINE | ID: mdl-29980704
ABSTRACT
We report quantitative characterization of the high temperature oxidation process by using electron tomography and energy-dispersive X-ray spectroscopy. As a proof of principle, we performed 3D imaging of the oxidation layer of a model system (Mo3Si) at nanoscale resolution with elemental specificity and probed the oxidation kinetics as a function of the oxidation time and the elevated temperature. Our tomographic reconstructions provide detailed 3D structural information of the surface oxidation layer of the Mo3Si system, revealing the evolution of oxidation behavior of Mo3Si from early stage to mature stage. Based on the relative rate of oxidation of Mo3Si, the volatilization rate of MoO3 and reactive molecular dynamics simulations, we propose a model to explain the mechanism of the formation of the porous silica structure during the oxidation process of Mo3Si. We expect that this 3D quantitative characterization method can be applied to other material systems to probe their structure-property relationships in different environments.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Estados Unidos
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Estados Unidos