Analysis of Electron Transparent Beam-Sensitive Samples Using Scanning Electron Microscopy Coupled With Energy-Dispersive X-ray Spectroscopy.

Brostrøm, Anders; Kling, Kirsten Inga; Hougaard, Karin Sørig; Mølhave, Kristian

Brostrøm, Anders; Kling, Kirsten Inga; Hougaard, Karin Sørig; Mølhave, Kristian.

Afiliação

Brostrøm A; Technical University of Denmark, DTU Nanolab - National Centre for Nano Fabrication and Characterization, Fysikvej, Building 307, Kgs Lyngby2800, Denmark.
Kling KI; National Research Centre for the Working Environment, Lersø Parkallé 105, Copenhagen2100, Denmark.
Hougaard KS; Technical University of Denmark, DTU Nanolab - National Centre for Nano Fabrication and Characterization, Fysikvej, Building 307, Kgs Lyngby2800, Denmark.
Mølhave K; SAXOCON A/S, Bredevej 2D, Virum2830, Denmark.

Microsc Microanal ; 26(3): 373-386, 2020 Jun.

Article em En | MEDLINE | ID: mdl-32475372

Palavras-chave

aerosol; electron microscopy; energy-dispersive X-ray spectroscopy; particle

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Microsc Microanal Ano de publicação: 2020 Tipo de documento: Article País de afiliação: Dinamarca

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