Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector.

Chen, Xi; Hauwiller, Matthew R; Kumar, Abinash; Penn, Aubrey N; LeBeau, James M

Chen, Xi; Hauwiller, Matthew R; Kumar, Abinash; Penn, Aubrey N; LeBeau, James M.

Afiliação

Chen X; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA02139, USA.
Hauwiller MR; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA02139, USA.
Kumar A; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA02139, USA.
Penn AN; Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC27606, USA.
LeBeau JM; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA02139, USA.

Microsc Microanal ; 26(5): 938-943, 2020 Oct.

Article em En | MEDLINE | ID: mdl-32778194

Palavras-chave

diffuse scattering; direct electron cameras; electron diffraction; high dynamic range

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2020 Tipo de documento: Article País de afiliação: Estados Unidos

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