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Effects of Processing-Induced Contamination on Organic Electronic Devices.
Simatos, Dimitrios; Jacobs, Ian E; Dobryden, Illia; Nguyen, Malgorzata; Savva, Achilleas; Venkateshvaran, Deepak; Nikolka, Mark; Charmet, Jérôme; Spalek, Leszek J; Gicevicius, Mindaugas; Zhang, Youcheng; Schweicher, Guillaume; Howe, Duncan J; Ursel, Sarah; Armitage, John; Dimov, Ivan B; Kraft, Ulrike; Zhang, Weimin; Alsufyani, Maryam; McCulloch, Iain; Owens, Róisín M; Claesson, Per M; Knowles, Tuomas P J; Sirringhaus, Henning.
Afiliação
  • Simatos D; Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Jacobs IE; Yusuf Hamied Department of Chemistry, University of Cambridge, Cambridge, CB2 1EW, UK.
  • Dobryden I; Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Nguyen M; RISE Research Institutes of Sweden, Division of Bioeconomy and Health, Department of Material and Surface Design, RISE Research Institutes of Sweden, 11486, Stockholm, Sweden.
  • Savva A; Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Venkateshvaran D; Department of Chemical Engineering and Biotechnology, University of Cambridge, Cambridge, CB3 OAS, UK.
  • Nikolka M; Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Charmet J; Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Spalek LJ; School of Engineering-HE-Arc Ingénierie, HES-SO University of Applied Sciences Western Switzerland, 2000, Neuchâtel, Switzerland.
  • Gicevicius M; Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Zhang Y; Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Schweicher G; Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Howe DJ; Laboratoire de Chimie des Polymères, Faculté des Sciences, Université Libre de Bruxelles (ULB), 1050, Bruxelles, Belgium.
  • Ursel S; Yusuf Hamied Department of Chemistry, University of Cambridge, Cambridge, CB2 1EW, UK.
  • Armitage J; Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Dimov IB; Optoelectronics Group, Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
  • Kraft U; Electrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, CB3 0FA, UK.
  • Zhang W; Department of Molecular Electronics, Max Planck Institute for Polymer Research, 55128, Mainz, Germany.
  • Alsufyani M; Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Saudi Arabia.
  • McCulloch I; Department of Chemistry, University of Oxford, Oxford, OX1 3TA, UK.
  • Owens RM; Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Saudi Arabia.
  • Claesson PM; Department of Chemistry, University of Oxford, Oxford, OX1 3TA, UK.
  • Knowles TPJ; Department of Chemical Engineering and Biotechnology, University of Cambridge, Cambridge, CB3 OAS, UK.
  • Sirringhaus H; KTH Royal Institute of Technology, School of Engineering Sciences in Chemistry, Biotechnology and Health, Department of Chemistry, Division of Surface and Corrosion Science, 10044, Stockholm, Sweden.
Small Methods ; 7(11): e2300476, 2023 Nov.
Article em En | MEDLINE | ID: mdl-37661594
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Small Methods Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Reino Unido
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Small Methods Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Reino Unido