Your browser doesn't support javascript.
loading
Quantification of bacterial adhesion forces using atomic force microscopy (AFM).
Fang, H H; Chan, K Y; Xu, L C.
Afiliação
  • Fang HH; Centre for Environmental Engineering Research, Department of Civil Engineering, The University of Hong Kong, Hong Kong. hrechef@hkucc.hku.hk
J Microbiol Methods ; 40(1): 89-97, 2000 Mar.
Article em En | MEDLINE | ID: mdl-10739347
ABSTRACT
This study demonstrated that atomic force microscopy (AFM) can be used to obtain high-resolution topographical images of bacteria, and to quantify the tip-cell interaction force and the surface elasticity. Results show that the adhesion force between the Si3N4 tip and the bacteria surface was in the range from -3.9 to -4.3 nN. On the other hand, the adhesion forces at the periphery of the cell-substratum contact surface ranged from -5.1 to -5.9 nN and those at the cell-cell interface ranged from -6.5 to -6.8 nN. The two latter forces were considerably greater than the former one, most likely due to the accumulation of extracellular polymer substance (EPS). Results also show that the elasticity varied on the cell surface.
Assuntos
Buscar no Google
Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Aderência Bacteriana / Bactérias Redutoras de Enxofre / Microscopia de Força Atômica / Biofilmes Idioma: En Revista: J Microbiol Methods Ano de publicação: 2000 Tipo de documento: Article País de afiliação: Hong Kong
Buscar no Google
Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Aderência Bacteriana / Bactérias Redutoras de Enxofre / Microscopia de Força Atômica / Biofilmes Idioma: En Revista: J Microbiol Methods Ano de publicação: 2000 Tipo de documento: Article País de afiliação: Hong Kong