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P(N) approximation for frequency-domain measurements in scattering media.
Faris, Gregory W.
Afiliação
  • Faris GW; Molecular Physics Laboratory, SRI International, Menlo Park, California 94025-3493, USA. gregory.faris@sri.com
Appl Opt ; 44(11): 2058-71, 2005 Apr 10.
Article em En | MEDLINE | ID: mdl-15835355
ABSTRACT
Presented here are expressions for the P(N) approximation for light propagation in scattering media in the frequency domain. To elucidate parametric dependencies, the derivation uses normalization of the resulting expressions to either the total interaction coefficient or the reduced total interaction coefficient. For the latter case, a set of reduced phase function coefficients are introduced. Expression of the P(N) approximation as a conventional eigenvalue problem facilitates computation of the eigenvalues or attenuation coefficients. This approach is used to determine the attenuation coefficients in the asymptotic regime over the full values of the scattering albedo and reduced scattering albedo (0 to 1) and all positive values of the asymmetry factor (0 to 1). Frequency-domain measurements yield a sensitivity to turbid media optical properties for reduced scattering albedos as small as 0.2. P(N) calculations are used to assess the magnitude of errors associated with the P1 and P3 approximations over a range of scattering albedo, phase function, and modulation frequency.
Assuntos
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Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Refratometria / Interpretação de Imagem Assistida por Computador / Modelos Biológicos / Nefelometria e Turbidimetria Tipo de estudo: Diagnostic_studies / Evaluation_studies / Prognostic_studies Idioma: En Revista: Appl Opt Ano de publicação: 2005 Tipo de documento: Article País de afiliação: Estados Unidos
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Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Refratometria / Interpretação de Imagem Assistida por Computador / Modelos Biológicos / Nefelometria e Turbidimetria Tipo de estudo: Diagnostic_studies / Evaluation_studies / Prognostic_studies Idioma: En Revista: Appl Opt Ano de publicação: 2005 Tipo de documento: Article País de afiliação: Estados Unidos