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Performance comparison of cross-like Hall plates with different covering layers.
Lyu, Fei; Zhang, Zhenyan; Toh, Eng-Huat; Liu, Xinfu; Ding, Yinjie; Pan, Yifan; Li, Chengjie; Li, Li; Sha, Jin; Pan, Hongbing.
Afiliação
  • Lyu F; School of Electronic Science & Engineering, Nanjing University, Nanjing 210093, China. lvfeieric@gmail.com.
  • Zhang Z; School of Electronic Science & Engineering, Nanjing University, Nanjing 210093, China. zhangzhenyan518@163.com.
  • Toh EH; GLOBALFOUNDRIES Singapore, Singapore 738406, Singapore. EngHuat.TOH@globalfoundries.com.
  • Liu X; GLOBALFOUNDRIES Singapore, Singapore 738406, Singapore. XinFu.LIU@globalfoundries.com.
  • Ding Y; GLOBALFOUNDRIES Singapore, Singapore 738406, Singapore. YINJIE.DING@globalfoundries.com.
  • Pan Y; Nanjing Foreign Language School, Nanjing 210008, China. panyifanhappy@163.com.
  • Li C; School of Electronic Science & Engineering, Nanjing University, Nanjing 210093, China. lichengjie.520@163.com.
  • Li L; School of Electronic Science & Engineering, Nanjing University, Nanjing 210093, China. lili@nju.edu.cn.
  • Sha J; School of Electronic Science & Engineering, Nanjing University, Nanjing 210093, China. shajin@nju.edu.cn.
  • Pan H; School of Electronic Science & Engineering, Nanjing University, Nanjing 210093, China. phb@nju.edu.cn.
Sensors (Basel) ; 15(1): 672-86, 2014 Dec 31.
Article em En | MEDLINE | ID: mdl-25559001
ABSTRACT
This paper studies the effects of the covering layers on the performance of a cross-like Hall plate. Three different structures of a cross-like Hall plate in various sizes are designed and analyzed. The Hall plate sensitivity and offset are characterized using a self-built measurement system. The effect of the P-type region over the active area on the current-related sensitivity is studied for different Hall plate designs. In addition, the correlation between the P-type covering layer and offset is analyzed. The best structure out of three designs is determined. Besides, a modified eight-resistor circuit model for the Hall plate is presented with improved accuracy by taking the offset into account.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2014 Tipo de documento: Article País de afiliação: China

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2014 Tipo de documento: Article País de afiliação: China